Press Releases

Checkpoint Technologies Announces Vis-SIL: Visible Laser Probing Of IC’s – 10 Nm Nodes Down To 5 Nm

April 5, 2016

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Checkpoint Announces 125nm Optical Resolution Breakthrough with Visible Light

December 10, 2015

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Checkpoint Technologies Announces InfraScan™ ES400C a Complete Optical Debugging and Failure Analysis Tool

December 3, 2015

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Checkpoint Technologies, LLC, noted supplier of laser scanning and photon emission microscopy systems for the failure analysis industry, announces the release of InfraScan(tm) TDM

October 24, 2015

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Checkpoint Technologies, LLC, announces the release of the InfraScan™ ES400C-LW

October 2, 2015

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Checkpoint Technologies, LLC Releases First Production 3.3 NA SIL Objective

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